- microelectronic circuits (or chips)
- Макаров: микроэлектронные схемы (или чипсы)
Универсальный англо-русский словарь. Академик.ру. 2011.
Универсальный англо-русский словарь. Академик.ру. 2011.
MOSFET — Two power MOSFETs in the surface mount package D2PAK. Operating as switches, each of these components can sustain a blocking voltage of 120 volts in the OFF state, and can conduct a continuous current of 30 amperes in the ON state, dissipating up … Wikipedia
Transistor — For other uses, see Transistor (disambiguation). Assorted discrete transistors. Packages in order from top to bottom: TO 3, TO 126, TO 92, SOT 23 A transistor is a semiconductor device used to amplify and switch electronic signals and power. It… … Wikipedia
CEITEC — For the Central European Institute of Technology, see CEITEC (Central European Institute of Technology) CEITEC Type Government owned corporation Industry Semiconductors Founded November 7, 2008 (2008 11 07) [ … Wikipedia
Transconductance — Transconductance, also known as mutual conductance[citation needed], is a property of certain electronic components. Conductance is the reciprocal of resistance; transconductance, meanwhile, is the ratio of the current change at the output port… … Wikipedia
integrated circuit — Electronics. a circuit of transistors, resistors, and capacitors constructed on a single semiconductor wafer or chip, in which the components are interconnected to perform a given function. Abbr.: IC Also called microcircuit. [1955 60] * * * ▪… … Universalium
Radiation hardening — is a method of designing and testing electronic components and systems to make them resistant to damage or malfunctions caused by ionizing radiation (particle radiation and high energy electromagnetic radiation),[1] such as would be encountered… … Wikipedia
Wafer (electronics) — Polished 12 and 6 silicon wafers. The flat cut into the right wafer indicates its doping and crystallographic orientation (see below) … Wikipedia
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Central processing unit — CPU redirects here. For other uses, see CPU (disambiguation). An Intel 80486DX2 CPU from above An Intel 80486DX2 from below … Wikipedia
Electronic circuit — The die from an Intel 8742, an 8 bit microcontroller that includes a CPU, 128 bytes of RAM, 2048 bytes of EPROM, and I/O in the same chip … Wikipedia